Guest Editors' Introduction: Special Issue on Machine Learning for CAD/EDA

Ulf Schlichtmann; Bing Li; Bei Yu; Raviv Gal

doi:10.1109/MDAT.2022.3229967

Guest Editors' Introduction: Special Issue on Machine Learning for CAD/EDA

Ulf Schlichtmann
, Bing Li
, Bei Yu
, Raviv Gal

Chair of Electronic Design Automation

Technical University of Munich
Chinese University of Hong Kong
IBM Haifa

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	5-7
Number of pages	3
Journal	IEEE Design and Test
Volume	40
Issue number	1
DOIs	https://doi.org/10.1109/MDAT.2022.3229967
State	Published - 1 Feb 2023

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10.1109/MDAT.2022.3229967

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title = "Guest Editors' Introduction: Special Issue on Machine Learning for CAD/EDA",

author = "Ulf Schlichtmann and Bing Li and Bei Yu and Raviv Gal",

note = "Funding Information: We would like to acknowledge all the authors for their contributions. Without their technical and scientific expertise and their dedicated effort, this special issue would obviously not exist. A significant number of anonymous expert reviewers ensured in multiple rounds of reviews that only the most suitable manuscripts found their way into this special issue and helped to improve those successful manuscripts with their expertise and insights.",

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N1 - Funding Information: We would like to acknowledge all the authors for their contributions. Without their technical and scientific expertise and their dedicated effort, this special issue would obviously not exist. A significant number of anonymous expert reviewers ensured in multiple rounds of reviews that only the most suitable manuscripts found their way into this special issue and helped to improve those successful manuscripts with their expertise and insights.

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Guest Editors' Introduction: Special Issue on Machine Learning for CAD/EDA

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