Keyphrases
Graph Neural Network
100%
Process Variation
100%
Static Timing Analysis
100%
Circuit Reliability
100%
Reliability Degradation
100%
Guard Band
66%
Device Aging
66%
Standard Cell Library
66%
Neural Network Model
33%
Measure Data
33%
Physics-based
33%
Transistor
33%
Monte Carlo Simulation
33%
Performance Overhead
33%
RISC-V Processor
33%
Worst-case Analysis
33%
Aging-aware
33%
All-Path
33%
Modeling Standards
33%
Transistor Model
33%
Aging Model
33%
Timing Violation
33%
Mean Absolute Error
33%
Reliability Estimation
33%
Atomic Level
33%
Foundry
33%
Statistical Delay
33%
Delay Distribution
33%
Delayed Degradation
33%
FinFET Technology
33%
Advanced Technology Node
33%
Technology Model
33%
Computer Science
Graph Neural Network
100%
Timing Analysis
100%
Process Variation
100%
Neural Network Model
33%
Monte Carlo Simulation
33%
Mean Absolute Error
33%
Delay Distribution
33%
Transistor Model
33%
Measurement Data
33%
Engineering
Process Variation
100%
Nodes
33%
Measurement Data
33%
Worst Case Analysis
33%
Reliability Estimation
33%
Circuit Designer
33%
Network Model
33%
Mean Absolute Error
33%
Material Science
Electronic Circuit
100%
Transistor
50%