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Gd2O3 nanostructured thin films analyzed by XPS

  • Davide Barreca
  • , Alberto Gasparotto
  • , Andrian Milanov
  • , Eugenio Tondello
  • , Anjana Devi
  • , Roland A. Fischer
  • University of Padova
  • Max-Planck-lnstitut für Kohlenforschung

Research output: Contribution to journalArticlepeer-review

47 Scopus citations

Abstract

The present work was devoted to the X-ray photoelectron spectroscopy (XPS) investigation of the principal core levels of a nanostructured Gd2O3 thin film. The sample was synthesized by metal organic chemical vapor deposition (MOCVD) from Gd((iPrN)2CNMe2)3 as precursor at 500 °C in an N2/O2 atmosphere. XPS results evidenced a marked Gd2O3 reactivity towards atmospheric CO2 and H2O, leading to a surface composition characterized by the co-presence of gadolinium carbonates/bicarbonates and hydroxides.

Original languageEnglish
Article numberSSSPEN000014000001000060000001
Pages (from-to)60-67
Number of pages8
JournalSurface Science Spectra
Volume14
Issue number1-4
DOIs
StatePublished - 2007
Externally publishedYes

Keywords

  • GdO
  • High-k
  • MOCVD
  • Thin films
  • X-ray photoelectron spectroscopy

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