Abstract
Low-dropout (LDO) voltage regulators are widely used to supply low-voltage digital circuits. For recent ultra-low-power microcontroller systems, a fully-integrated LDO without any external capacitance is preferred in order to achieve a fast and energy-efficient wake-up. Commonly, an LDO is specified, designed and verified for DC load currents. In contrast, a digital load creates large current spikes. As an LDO designed for low quiescent current is too slow to react on fast current spikes, a minimum on-chip capacitance is required to keep the supply voltage within a certain error window. Different fully-integrated LDO topologies are investigated regarding their suitability to supply low-voltage digital circuits. The any-load stable LDO topology is selected and implemented on a 0.13 μm test-chip. The LDO is able to provide a maximum load current of 2.5 mA while consuming a quiescent current of 17 μA.
| Original language | English |
|---|---|
| Pages (from-to) | 263-267 |
| Number of pages | 5 |
| Journal | Advances in Radio Science |
| Volume | 9 |
| DOIs | |
| State | Published - 2011 |
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