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Freestanding GaN-substrates and devices

  • Walter Schottky Institut
  • Agilent Technologies Sales and Services GmbH and Co. KG
  • Ilmenau University of Technology

Research output: Contribution to journalArticlepeer-review

65 Scopus citations

Abstract

Various physical aspects and potential applications of the laser-induced separation of GaN epilayers from their sapphire substrate are reviewed. The effect of short laser pulses on the thermal decomposition of GaN and possible applications of the laser-induced dissociation of GaN for fast etching of this material is discussed. Particular emphasis is placed on the defect-free delamination of large area GaN films with thicknesses ranging from 3 to 300 μm from sapphire substrates. The use of the resulting freestanding GaN films in device technology and homoepitaxy of III-nitrides are outlined. Specific examples are the flip-chip bonding of freestanding InGaN/GaN LEDs to a silicon submount and the production of pseudosubstrates for the homoepitaxy of high quality GaN epilayers.

Original languageEnglish
Pages (from-to)1627-1650
Number of pages24
JournalPhysica Status Solidi C: Conferences
Volume0
Issue number6 SPEC. ISS.
DOIs
StatePublished - 2003

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