Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation

Research output: Contribution to journalArticlepeer-review

148 Scopus citations

Fingerprint

Dive into the research topics of 'Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science