TY - JOUR
T1 - Fourier-transform mass spectroscopic studies of ionized atoms and clusters produced by laser vaporization of metals and semiconductors
AU - Reents, W. D.
AU - Bondybey, V. E.
PY - 1986/4/11
Y1 - 1986/4/11
N2 - A Fourier-transform mass spectrometer (FTMS) has been used to trap and detect cluster ions formed by laser vaporization of metals and semiconductors. It is shown that the technique works for those elements whose equilibrium vapors tend to contain molecular species. For more" typical" metals whose vapors are usually monatomic including most transition metals, only monatomic ions are obtained. Cluster ions were observed for silicon, germanium, and bismuth. No cluster ions were observed for aluminum, scandium, vanadium, or niobium.
AB - A Fourier-transform mass spectrometer (FTMS) has been used to trap and detect cluster ions formed by laser vaporization of metals and semiconductors. It is shown that the technique works for those elements whose equilibrium vapors tend to contain molecular species. For more" typical" metals whose vapors are usually monatomic including most transition metals, only monatomic ions are obtained. Cluster ions were observed for silicon, germanium, and bismuth. No cluster ions were observed for aluminum, scandium, vanadium, or niobium.
UR - http://www.scopus.com/inward/record.url?scp=0039334870&partnerID=8YFLogxK
U2 - 10.1016/0009-2614(86)85165-X
DO - 10.1016/0009-2614(86)85165-X
M3 - Article
AN - SCOPUS:0039334870
SN - 0009-2614
VL - 125
SP - 324
EP - 327
JO - Chemical Physics Letters
JF - Chemical Physics Letters
IS - 4
ER -