TY - GEN
T1 - Formal approaches to analog circuit verification
AU - Barke, Erich
AU - Grabowski, Darius
AU - Graeb, Helmut
AU - Hedrich, Lars
AU - Heinen, Stefan
AU - Popp, Ralf
AU - Steinhorst, Sebastian
AU - Yifan, Wang
PY - 2009
Y1 - 2009
N2 - For a speed-up of analog design cycles to keep up with the continuously decreasing time to market, iterative design refinement and redesigns are more than ever regarded as showstoppers. To deal with this issue, referred to as design and verification gap, the development of a continuous and consistent verification is mandatory. In digital design, formal verification methods are considered as a key technology for efficient design flows. However, industrial availability of formal methods for analog circuit verification is still negligible despite a growing need. In recent years, research institutions have made considerable advances in the area of formal verification of analog circuits. This paper presents a selection of four recent approaches in analog verification that cover a broad scope of verification philosophies.
AB - For a speed-up of analog design cycles to keep up with the continuously decreasing time to market, iterative design refinement and redesigns are more than ever regarded as showstoppers. To deal with this issue, referred to as design and verification gap, the development of a continuous and consistent verification is mandatory. In digital design, formal verification methods are considered as a key technology for efficient design flows. However, industrial availability of formal methods for analog circuit verification is still negligible despite a growing need. In recent years, research institutions have made considerable advances in the area of formal verification of analog circuits. This paper presents a selection of four recent approaches in analog verification that cover a broad scope of verification philosophies.
UR - http://www.scopus.com/inward/record.url?scp=70350041889&partnerID=8YFLogxK
U2 - 10.1109/date.2009.5090759
DO - 10.1109/date.2009.5090759
M3 - Conference contribution
AN - SCOPUS:70350041889
SN - 9783981080155
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 724
EP - 729
BT - Proceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
Y2 - 20 April 2009 through 24 April 2009
ER -