FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies

DIvya Praneetha Ravipati, Rajesh Kedia, Victor M. Van Santen, Jorg Henkel, Preeti Ranjan Panda, Hussam Amrouch

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Cache memories are an indispensable component of many processor-based systems and contribute significantly to the overall area, power consumption, and delay. This leads to an important role played by modeling tools for estimating the area, power consumption, and access time of cache memories. However, existing modeling tools such as CACTI and its various extensions have been primarily designed using data from various projections. For the first time, we propose an entire flow for obtaining/calibrating the transistor characteristics from a commercial technology and use these characteristics within CACTI. We also improve the modeling approach to make them more fine-grained and follow recent manufacturing trends suitable for FinFET technology. Further, for the first time, we extend CACTI to support negative capacitance fin field effect transistor (NC-FinFET), an emerging technology depicting negative capacitance whose current and capacitive characteristics are very different compared to those of the FinFET. We use the proposed tool (FN-CACTI) to identify NC-FinFET-based caches to be significantly more energy-efficient than corresponding FinFET-based caches. We also study an application of FN-CACTI to determine optimal voltages corresponding to the lowest energy consumption for NC-FinFET and FinFET-based caches of various sizes.

Original languageEnglish
Pages (from-to)339-352
Number of pages14
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume30
Issue number3
DOIs
StatePublished - 1 Mar 2022
Externally publishedYes

Keywords

  • CACTI
  • Cache modeling
  • FinFET
  • emerging technology
  • negative capacitance fin field effect transistor (NC-FinFET)

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