TY - JOUR
T1 - FN-CACTI
T2 - Advanced CACTI for FinFET and NC-FinFET Technologies
AU - Ravipati, DIvya Praneetha
AU - Kedia, Rajesh
AU - Van Santen, Victor M.
AU - Henkel, Jorg
AU - Panda, Preeti Ranjan
AU - Amrouch, Hussam
N1 - Publisher Copyright:
© 1993-2012 IEEE.
PY - 2022/3/1
Y1 - 2022/3/1
N2 - Cache memories are an indispensable component of many processor-based systems and contribute significantly to the overall area, power consumption, and delay. This leads to an important role played by modeling tools for estimating the area, power consumption, and access time of cache memories. However, existing modeling tools such as CACTI and its various extensions have been primarily designed using data from various projections. For the first time, we propose an entire flow for obtaining/calibrating the transistor characteristics from a commercial technology and use these characteristics within CACTI. We also improve the modeling approach to make them more fine-grained and follow recent manufacturing trends suitable for FinFET technology. Further, for the first time, we extend CACTI to support negative capacitance fin field effect transistor (NC-FinFET), an emerging technology depicting negative capacitance whose current and capacitive characteristics are very different compared to those of the FinFET. We use the proposed tool (FN-CACTI) to identify NC-FinFET-based caches to be significantly more energy-efficient than corresponding FinFET-based caches. We also study an application of FN-CACTI to determine optimal voltages corresponding to the lowest energy consumption for NC-FinFET and FinFET-based caches of various sizes.
AB - Cache memories are an indispensable component of many processor-based systems and contribute significantly to the overall area, power consumption, and delay. This leads to an important role played by modeling tools for estimating the area, power consumption, and access time of cache memories. However, existing modeling tools such as CACTI and its various extensions have been primarily designed using data from various projections. For the first time, we propose an entire flow for obtaining/calibrating the transistor characteristics from a commercial technology and use these characteristics within CACTI. We also improve the modeling approach to make them more fine-grained and follow recent manufacturing trends suitable for FinFET technology. Further, for the first time, we extend CACTI to support negative capacitance fin field effect transistor (NC-FinFET), an emerging technology depicting negative capacitance whose current and capacitive characteristics are very different compared to those of the FinFET. We use the proposed tool (FN-CACTI) to identify NC-FinFET-based caches to be significantly more energy-efficient than corresponding FinFET-based caches. We also study an application of FN-CACTI to determine optimal voltages corresponding to the lowest energy consumption for NC-FinFET and FinFET-based caches of various sizes.
KW - CACTI
KW - Cache modeling
KW - FinFET
KW - emerging technology
KW - negative capacitance fin field effect transistor (NC-FinFET)
UR - http://www.scopus.com/inward/record.url?scp=85126325434&partnerID=8YFLogxK
U2 - 10.1109/TVLSI.2021.3123112
DO - 10.1109/TVLSI.2021.3123112
M3 - Article
AN - SCOPUS:85126325434
SN - 1063-8210
VL - 30
SP - 339
EP - 352
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IS - 3
ER -