First results of X-SAR interferometry

Joao Moreira; M. Schwaebisch; G. Fornaro; Riccardo Lanari; Richard Bamler; Dieter Just; U. Steinbrecher; H. Breit; M. Eineder; Giorgio Franceschetti; D. Geudtner; H. Rinkel

First results of X-SAR interferometry

Joao Moreira
, M. Schwaebisch
, G. Fornaro
, Riccardo Lanari
, Richard Bamler
, Dieter Just
, U. Steinbrecher
, H. Breit
, M. Eineder
, Giorgio Franceschetti
, D. Geudtner
, H. Rinkel

Deutsches Zentrum für Luft- und Raumfahrt e.V. (DLR)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Repeat-pass interferometry data have been acquired during the first and second SIR-C/X-SAR missions in April and October 1994. This paper presents the first results from X-SAR interferometry on four different sites. The temporal separations were one day and six months. At two sites the coherence requirements were met, resulting in high quality interferograms. A digital elevation model has been derived. The limitations of the X-SAR interferometry are discussed.

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	Christopher J. Oliver, Shahram Tajbakhsh, Giorgio Franceschetti, James C. Shiue
Pages	343-355
Number of pages	13
State	Published - 1995
Externally published	Yes
Event	Synthetic Aperture Radar and Passive Microwave Sensing - Paris, Fr Duration: 25 Sep 1995 → 25 Sep 1995

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2584
ISSN (Print)	0277-786X

Conference

Conference	Synthetic Aperture Radar and Passive Microwave Sensing
City	Paris, Fr
Period	25/09/95 → 25/09/95

Cite this

Moreira, J., Schwaebisch, M., Fornaro, G., Lanari, R., Bamler, R., Just, D., Steinbrecher, U., Breit, H., Eineder, M., Franceschetti, G., Geudtner, D., & Rinkel, H. (1995). First results of X-SAR interferometry. In C. J. Oliver, S. Tajbakhsh, G. Franceschetti, & J. C. Shiue (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 343-355). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2584).

@inproceedings{cc74ba39cb194cdea8f66d78d1814391,

title = "First results of X-SAR interferometry",

abstract = "Repeat-pass interferometry data have been acquired during the first and second SIR-C/X-SAR missions in April and October 1994. This paper presents the first results from X-SAR interferometry on four different sites. The temporal separations were one day and six months. At two sites the coherence requirements were met, resulting in high quality interferograms. A digital elevation model has been derived. The limitations of the X-SAR interferometry are discussed.",

author = "Joao Moreira and M. Schwaebisch and G. Fornaro and Riccardo Lanari and Richard Bamler and Dieter Just and U. Steinbrecher and H. Breit and M. Eineder and Giorgio Franceschetti and D. Geudtner and H. Rinkel",

year = "1995",

language = "English",

isbn = "0819419486",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

pages = "343--355",

editor = "Oliver, \{Christopher J.\} and Shahram Tajbakhsh and Giorgio Franceschetti and Shiue, \{James C.\}",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "Synthetic Aperture Radar and Passive Microwave Sensing ; Conference date: 25-09-1995 Through 25-09-1995",

}

Moreira, J, Schwaebisch, M, Fornaro, G, Lanari, R, Bamler, R, Just, D, Steinbrecher, U, Breit, H, Eineder, M, Franceschetti, G, Geudtner, D & Rinkel, H 1995, First results of X-SAR interferometry. in CJ Oliver, S Tajbakhsh, G Franceschetti & JC Shiue (eds), Proceedings of SPIE - The International Society for Optical Engineering. Proceedings of SPIE - The International Society for Optical Engineering, vol. 2584, pp. 343-355, Synthetic Aperture Radar and Passive Microwave Sensing, Paris, Fr, 25/09/95.

First results of X-SAR interferometry. / Moreira, Joao; Schwaebisch, M.; Fornaro, G. et al.
Proceedings of SPIE - The International Society for Optical Engineering. ed. / Christopher J. Oliver; Shahram Tajbakhsh; Giorgio Franceschetti; James C. Shiue. 1995. p. 343-355 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2584).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - First results of X-SAR interferometry

AU - Moreira, Joao

AU - Schwaebisch, M.

AU - Fornaro, G.

AU - Lanari, Riccardo

AU - Bamler, Richard

AU - Just, Dieter

AU - Steinbrecher, U.

AU - Breit, H.

AU - Eineder, M.

AU - Franceschetti, Giorgio

AU - Geudtner, D.

AU - Rinkel, H.

PY - 1995

Y1 - 1995

N2 - Repeat-pass interferometry data have been acquired during the first and second SIR-C/X-SAR missions in April and October 1994. This paper presents the first results from X-SAR interferometry on four different sites. The temporal separations were one day and six months. At two sites the coherence requirements were met, resulting in high quality interferograms. A digital elevation model has been derived. The limitations of the X-SAR interferometry are discussed.

AB - Repeat-pass interferometry data have been acquired during the first and second SIR-C/X-SAR missions in April and October 1994. This paper presents the first results from X-SAR interferometry on four different sites. The temporal separations were one day and six months. At two sites the coherence requirements were met, resulting in high quality interferograms. A digital elevation model has been derived. The limitations of the X-SAR interferometry are discussed.

UR - https://www.scopus.com/pages/publications/0029484188

M3 - Conference contribution

AN - SCOPUS:0029484188

SN - 0819419486

SN - 9780819419484

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 343

EP - 355

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Oliver, Christopher J.

A2 - Tajbakhsh, Shahram

A2 - Franceschetti, Giorgio

A2 - Shiue, James C.

T2 - Synthetic Aperture Radar and Passive Microwave Sensing

Y2 - 25 September 1995 through 25 September 1995

ER -

First results of X-SAR interferometry

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