First results of X-SAR interferometry

Joao Moreira, M. Schwaebisch, G. Fornaro, Riccardo Lanari, Richard Bamler, Dieter Just, U. Steinbrecher, H. Breit, M. Eineder, Giorgio Franceschetti, D. Geudtner, H. Rinkel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Repeat-pass interferometry data have been acquired during the first and second SIR-C/X-SAR missions in April and October 1994. This paper presents the first results from X-SAR interferometry on four different sites. The temporal separations were one day and six months. At two sites the coherence requirements were met, resulting in high quality interferograms. A digital elevation model has been derived. The limitations of the X-SAR interferometry are discussed.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsChristopher J. Oliver, Shahram Tajbakhsh, Giorgio Franceschetti, James C. Shiue
Pages343-355
Number of pages13
StatePublished - 1995
Externally publishedYes
EventSynthetic Aperture Radar and Passive Microwave Sensing - Paris, Fr
Duration: 25 Sep 199525 Sep 1995

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2584
ISSN (Print)0277-786X

Conference

ConferenceSynthetic Aperture Radar and Passive Microwave Sensing
CityParis, Fr
Period25/09/9525/09/95

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