Film-thickness dependence of structure formation in ultra-thin polymer blend films

J. S. Gutmann; P. Müller-Buschbaum; M. Stamm

doi:10.1007/s003390201855

Film-thickness dependence of structure formation in ultra-thin polymer blend films

J. S. Gutmann, P. Müller-Buschbaum, M. Stamm

Chair of Functional Materials

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

We investigated the film-thickness dependence of structure formation in ultra-thin polymer blend films prepared from solution. As a model system we used binary blends of statistical poly(styrene-co-p-bromostyrene) copolymers of different degrees of bromination. Ultra-thin-film samples differing in miscibility and film thickness were prepared via spin coating of common toluene solutions onto silicon (100) substrates. The resulting morphologies were investigated with scanning force microscopy, reflectometry and grazing-incidence scattering techniques using both X-rays and neutrons in order to obtain a picture of the sample structure at and below the sample surface.

Original language	English
Pages (from-to)	S463-S465
Journal	Applied Physics A: Materials Science and Processing
Volume	74
Issue number	SUPPL.I
DOIs	https://doi.org/10.1007/s003390201855
State	Published - Dec 2002

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Film-thickness dependence of structure formation in ultra-thin polymer blend films

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