TY - GEN
T1 - Fault Localization in Programmable Microfluidic Devices
AU - Bernardini, Alessandro
AU - Liu, Chunfeng
AU - Li, Bing
AU - Schlichtmann, Ulf
N1 - Publisher Copyright:
© 2019 EDAA.
PY - 2019/5/14
Y1 - 2019/5/14
N2 - Programmable Microfluidic Devices (PMDs) have revolutionized the traditional biochemical experiment flow. Test algorithms for PMDs have recently been proposed. Test patterns can be generated algorithmically. But an algorithm for fault localization once some faults have been identified is not yet available. When testing a PMD, once a test pattern fails it is unknown where the stuck valve is located. The stuck valve can be any one valve out of many valves forming the test pattern. In this paper, we propose an effective algorithm for the localization of stuck-at-0 faults and stuck-at-1 faults in a PMD. The stuck valve is localized either exactly or within a very small set of candidate valves. Once the locations of faulty valves are known, it becomes possible to continue to use the PMD by resynthesizing the application.
AB - Programmable Microfluidic Devices (PMDs) have revolutionized the traditional biochemical experiment flow. Test algorithms for PMDs have recently been proposed. Test patterns can be generated algorithmically. But an algorithm for fault localization once some faults have been identified is not yet available. When testing a PMD, once a test pattern fails it is unknown where the stuck valve is located. The stuck valve can be any one valve out of many valves forming the test pattern. In this paper, we propose an effective algorithm for the localization of stuck-at-0 faults and stuck-at-1 faults in a PMD. The stuck valve is localized either exactly or within a very small set of candidate valves. Once the locations of faulty valves are known, it becomes possible to continue to use the PMD by resynthesizing the application.
UR - http://www.scopus.com/inward/record.url?scp=85066637098&partnerID=8YFLogxK
U2 - 10.23919/DATE.2019.8715023
DO - 10.23919/DATE.2019.8715023
M3 - Conference contribution
AN - SCOPUS:85066637098
T3 - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
SP - 1607
EP - 1610
BT - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
Y2 - 25 March 2019 through 29 March 2019
ER -