Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study

Saed Abughannam, Liang Wu, Wolfgang Mueller, Christoph Scheytt, Wolfgang Ecker, Cristiano Novello

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The design of safety critical systems requires an efficient methodology for an effective fault effect simulation for analog and digital circuits where analog fault injection and fault effect simulation is currently a field of active research and commercial tools are not available yet. This article begins by discussing fault injection strategies for analog circuits applied on a case study with two topologies of a Voltage Controlled Oscillator (VCO). In the second part it performs on the basis of the example of a Wireless Sensor Network (WSN) node, how far different mixed level implementations with Verilog-A and SPICE can affect the simulation time and points out which component consumes the major part of the simulation time.

Original languageEnglish
Title of host publicationANALOG 2016 - 15. ITG/GMM-Fachtagung
PublisherVDE VERLAG GMBH
Pages75-80
Number of pages6
ISBN (Electronic)9783800742653
StatePublished - 2016
Externally publishedYes
Event15. ITG/GMM-Fachtagung ANALOG 2016 - 15th ITG/GMM Conference ANALOG 2016 - Bremen, Germany
Duration: 12 Sep 201614 Sep 2016

Publication series

NameANALOG 2016 - 15. ITG/GMM-Fachtagung

Conference

Conference15. ITG/GMM-Fachtagung ANALOG 2016 - 15th ITG/GMM Conference ANALOG 2016
Country/TerritoryGermany
CityBremen
Period12/09/1614/09/16

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