Fast automatic sizing of a charge pump phase-locked loop based on behavioral models

Jun Zou; Daniel Mueller; Helmut Graeb; Ulf Schlichtmann; Eckhard Hennig; Ralf Sommer

doi:10.1109/BMAS.2005.1518195

Fast automatic sizing of a charge pump phase-locked loop based on behavioral models

Jun Zou, Daniel Mueller, Helmut Graeb, Ulf Schlichtmann, Eckhard Hennig, Ralf Sommer

Chair of Electronic Design Automation

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

In this paper, we present an analog hierarchical sizing methodology applied to a third-order charge pump phase-locked loop (CPPLL). The key idea is to propagate the specifications from the requirements of the behavioral level to the circuit level. At the behavioral level, the performance is optimized while considering the potential capacity of the underlying circuits. Critical advantage of the illustrated methodology is a shortened PLL sizing process due to the use of fast-simulating models at behavioral level. The simulation results show the availability of this method on the CPPLL which makes an automatic sizing process actually feasible in terms of computation time.

Original language	English
Title of host publication	BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop
Pages	100-105
Number of pages	6
DOIs	https://doi.org/10.1109/BMAS.2005.1518195
State	Published - 2005
Event	BMAS 2005 - 2005 IEEE International Behavioral Modeling and Simulation Workshop - San Jose, CA, United States Duration: 22 Sep 2005 → 23 Sep 2005

Publication series

Name	BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop
Volume	2005

Conference

Conference	BMAS 2005 - 2005 IEEE International Behavioral Modeling and Simulation Workshop
Country/Territory	United States
City	San Jose, CA
Period	22/09/05 → 23/09/05

Keywords

Behavioral Modeling
Bottom-Up
Hierarchical Sizing
Locking Time
Phase Margin
Top-Down

Access to Document

10.1109/BMAS.2005.1518195

Cite this

Zou, J., Mueller, D., Graeb, H., Schlichtmann, U., Hennig, E., & Sommer, R. (2005). Fast automatic sizing of a charge pump phase-locked loop based on behavioral models. In BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop (pp. 100-105). Article 1518195 (BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop; Vol. 2005). https://doi.org/10.1109/BMAS.2005.1518195

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title = "Fast automatic sizing of a charge pump phase-locked loop based on behavioral models",

abstract = "In this paper, we present an analog hierarchical sizing methodology applied to a third-order charge pump phase-locked loop (CPPLL). The key idea is to propagate the specifications from the requirements of the behavioral level to the circuit level. At the behavioral level, the performance is optimized while considering the potential capacity of the underlying circuits. Critical advantage of the illustrated methodology is a shortened PLL sizing process due to the use of fast-simulating models at behavioral level. The simulation results show the availability of this method on the CPPLL which makes an automatic sizing process actually feasible in terms of computation time.",

keywords = "Behavioral Modeling, Bottom-Up, Hierarchical Sizing, Locking Time, Phase Margin, Top-Down",

author = "Jun Zou and Daniel Mueller and Helmut Graeb and Ulf Schlichtmann and Eckhard Hennig and Ralf Sommer",

year = "2005",

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isbn = "078039352X",

series = "BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop",

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note = "BMAS 2005 - 2005 IEEE International Behavioral Modeling and Simulation Workshop ; Conference date: 22-09-2005 Through 23-09-2005",

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Zou, J, Mueller, D, Graeb, H, Schlichtmann, U, Hennig, E & Sommer, R 2005, Fast automatic sizing of a charge pump phase-locked loop based on behavioral models. in BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop., 1518195, BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop, vol. 2005, pp. 100-105, BMAS 2005 - 2005 IEEE International Behavioral Modeling and Simulation Workshop, San Jose, CA, United States, 22/09/05. https://doi.org/10.1109/BMAS.2005.1518195

Fast automatic sizing of a charge pump phase-locked loop based on behavioral models. / Zou, Jun; Mueller, Daniel; Graeb, Helmut et al.
BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop. 2005. p. 100-105 1518195 (BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Fast automatic sizing of a charge pump phase-locked loop based on behavioral models

AU - Zou, Jun

AU - Mueller, Daniel

AU - Graeb, Helmut

AU - Schlichtmann, Ulf

AU - Hennig, Eckhard

AU - Sommer, Ralf

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AB - In this paper, we present an analog hierarchical sizing methodology applied to a third-order charge pump phase-locked loop (CPPLL). The key idea is to propagate the specifications from the requirements of the behavioral level to the circuit level. At the behavioral level, the performance is optimized while considering the potential capacity of the underlying circuits. Critical advantage of the illustrated methodology is a shortened PLL sizing process due to the use of fast-simulating models at behavioral level. The simulation results show the availability of this method on the CPPLL which makes an automatic sizing process actually feasible in terms of computation time.

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KW - Hierarchical Sizing

KW - Locking Time

KW - Phase Margin

KW - Top-Down

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Zou J, Mueller D, Graeb H, Schlichtmann U, Hennig E, Sommer R. Fast automatic sizing of a charge pump phase-locked loop based on behavioral models. In BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop. 2005. p. 100-105. 1518195. (BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop). doi: 10.1109/BMAS.2005.1518195

Fast automatic sizing of a charge pump phase-locked loop based on behavioral models

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