Factors impacting chemical degradation of perfluorinated sulfonic acid ionomers

H. Liu, H. A. Gasteiger, A. B. Laconti, J. Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

47 Scopus citations

Abstract

Several factors impacting chemical degradation of perfluorinated sulfonic acid ionomers are identified in this paper. Based on the results from this study, gas crossover is the fundamental mechanism that leads to PFSA membrane chemical degradation. H2, O2 and a catalytic surface are required to generate H2O2/radicals. The effect of electrochemically generated Pt oxide/hydroxide, Vulcan® XC-72R, Pt/C is clarified. Two major degradation pathways, H2O2 Pathway and Direct Radical Generation Pathway, are proposed. The impact of iron contamination and H2O2 concentration is also discussed. It was shown that a H2O2 flow cell is a better approach for membrane/MEA evaluation than conventional beaker based Fenton's tests (i.e., batch-like tests). copyright The Electrochemical Society.

Original languageEnglish
Title of host publicationDurability and Reliability of Low-Temperature Fuel Cells Systems
PublisherElectrochemical Society Inc.
Pages283-293
Number of pages11
Edition8
ISBN (Electronic)1566774918
ISBN (Print)1566774918, 9781566774918
DOIs
StatePublished - 2006
Externally publishedYes
EventSymposium on Durability and Reliability of Low-Temperature Fuel Cells Systems - 208th Meeting of the Electrochemical Society - Los Angeles, CA, United States
Duration: 16 Oct 200521 Oct 2005

Publication series

NameECS Transactions
Number8
Volume1
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

ConferenceSymposium on Durability and Reliability of Low-Temperature Fuel Cells Systems - 208th Meeting of the Electrochemical Society
Country/TerritoryUnited States
CityLos Angeles, CA
Period16/10/0521/10/05

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