Ex-situ and in-situ analysis of MoVTeNb oxide by aberration-corrected scanning transmission electron microscopy

Pinghong Xu; Maricruz Sanchez-Sanchez; Andre C. Van Veen; Nigel D. Browning; Johannes A. Lercher

doi:10.1017/S1431927614002268

Ex-situ and in-situ analysis of MoVTeNb oxide by aberration-corrected scanning transmission electron microscopy

Pinghong Xu, Maricruz Sanchez-Sanchez, Andre C. Van Veen, Nigel D. Browning, Johannes A. Lercher

Chair of Chemical Technology II

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	108-109
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614002268
State	Published - 1 Aug 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014

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10.1017/S1431927614002268

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title = "Ex-situ and in-situ analysis of MoVTeNb oxide by aberration-corrected scanning transmission electron microscopy",

author = "Pinghong Xu and Maricruz Sanchez-Sanchez and {Van Veen}, {Andre C.} and Browning, {Nigel D.} and Lercher, {Johannes A.}",

year = "2014",

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day = "1",

doi = "10.1017/S1431927614002268",

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journal = "Microscopy and Microanalysis",

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TY - JOUR

T1 - Ex-situ and in-situ analysis of MoVTeNb oxide by aberration-corrected scanning transmission electron microscopy

AU - Xu, Pinghong

AU - Sanchez-Sanchez, Maricruz

AU - Van Veen, Andre C.

AU - Browning, Nigel D.

AU - Lercher, Johannes A.

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927941171&partnerID=8YFLogxK

U2 - 10.1017/S1431927614002268

DO - 10.1017/S1431927614002268

M3 - Conference article

AN - SCOPUS:84927941171

SN - 1431-9276

VL - 20

SP - 108

EP - 109

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Ex-situ and in-situ analysis of MoVTeNb oxide by aberration-corrected scanning transmission electron microscopy

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