Evolution of transverse correlation in stochastic electromagnetic fields

Johannes A. Russer, Gabriele Gradoni, Gregor Tanner, Stephen C. Creagh, David Thomas, Christopher Smartt, Peter Russer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

19 Scopus citations

Abstract

In this work the evolution of the transverse correlation with increasing distance is investigated analytically and numerically. To characterize a stochastic EM field by measurements we have to sense the electromagnetic field in pairs of sampling points and to compute the correlations of all pairs. In the far-field, the field cross correlation functions depend only on the coordinate differences. This yields a considerable reduction of the measurement effort.

Original languageEnglish
Title of host publication2015 IEEE MTT-S International Microwave Symposium, IMS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479982752
DOIs
StatePublished - 24 Jul 2015
EventIEEE MTT-S International Microwave Symposium, IMS 2015 - Phoenix, United States
Duration: 17 May 201522 May 2015

Publication series

Name2015 IEEE MTT-S International Microwave Symposium, IMS 2015

Conference

ConferenceIEEE MTT-S International Microwave Symposium, IMS 2015
Country/TerritoryUnited States
CityPhoenix
Period17/05/1522/05/15

Keywords

  • Stochastic electromagnetic fields
  • electromagnetic interference
  • near-field scanning
  • noisy electromagnetic fiefs

Fingerprint

Dive into the research topics of 'Evolution of transverse correlation in stochastic electromagnetic fields'. Together they form a unique fingerprint.

Cite this