TY - GEN
T1 - Evidence of the interphase in epoxy nanocomposites
AU - Seiler, J.
AU - Kindersberger, J.
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014
Y1 - 2014
N2 - The improvement of electrical properties by adding nanoscale fillers to polymeric insulating materials is attributed to an interfacial area, the interphase, which is formed between the filler particles and the polymer matrix. Despite there are several models describing the interphase, a direct evidence for its existence in epoxy nanocomposites has not been provided so far. It is the aim of the present study to make the interphase visible. For this purpose nanoscale silica particles themselves and the same type of silica particles embedded in an epoxy nanocomposite were investigated by Atomic Force Microscopy (AFM) and Electric Force Microscopy (EFM). In the EFM images the filler particles appear larger when they are embedded in the composite material than they do when they are not embedded. This difference in size is attributed to the interphase surrounding the filler particles. By comparing the size of the filler particles themselves and the filler particles embedded in the composite material the thickness of the interphase is estimated. From the investigations it turns out that an interphase may be formed around filler particles in epoxy nanocomposites, and that AFM and EFM measurements are an appropriate method to make the interphase visible.
AB - The improvement of electrical properties by adding nanoscale fillers to polymeric insulating materials is attributed to an interfacial area, the interphase, which is formed between the filler particles and the polymer matrix. Despite there are several models describing the interphase, a direct evidence for its existence in epoxy nanocomposites has not been provided so far. It is the aim of the present study to make the interphase visible. For this purpose nanoscale silica particles themselves and the same type of silica particles embedded in an epoxy nanocomposite were investigated by Atomic Force Microscopy (AFM) and Electric Force Microscopy (EFM). In the EFM images the filler particles appear larger when they are embedded in the composite material than they do when they are not embedded. This difference in size is attributed to the interphase surrounding the filler particles. By comparing the size of the filler particles themselves and the filler particles embedded in the composite material the thickness of the interphase is estimated. From the investigations it turns out that an interphase may be formed around filler particles in epoxy nanocomposites, and that AFM and EFM measurements are an appropriate method to make the interphase visible.
UR - http://www.scopus.com/inward/record.url?scp=84988293822&partnerID=8YFLogxK
U2 - 10.1109/ICHVE.2014.7035442
DO - 10.1109/ICHVE.2014.7035442
M3 - Conference contribution
AN - SCOPUS:84988293822
T3 - ICHVE 2014 - 2014 International Conference on High Voltage Engineering and Application
BT - ICHVE 2014 - 2014 International Conference on High Voltage Engineering and Application
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 4th International Conference on High Voltage Engineering and Application, ICHVE 2014
Y2 - 8 September 2014 through 11 September 2014
ER -