Abstract
Electrooptic-sampling necessitates a variety of probing geometries which include tilted astigmatic Gaussian sampling beams, whose field distribution has to be taken into consideration in the evaluation of the electrooptic-sampling signal. The generation of a tilted beam can be accomplished via an off-axis focussing lens. The formalism of ray matrices in geometrical optics is not adequate for waves with a field component in direction of the beam propagation. However, using Fresnels diffraction integral we derived the complex beam parameters for off-axis systems which are valid for half apex angles less than 12°. In addition, the sampling beam undergoes diffraction and aperture masking.
| Original language | English |
|---|---|
| Pages (from-to) | 1699-1702 |
| Number of pages | 4 |
| Journal | IEEE MTT-S International Microwave Symposium Digest |
| Volume | 3 |
| State | Published - 1996 |
| Event | Proceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest. Part 1 (of 3) - San Franscisco, CA, USA Duration: 17 Jun 1996 → 21 Jun 1996 |
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