TY - GEN
T1 - ETISS-ML
T2 - 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
AU - Mueller-Gritschneder, Daniel
AU - Dittrich, Martin
AU - Weinzierl, Josef
AU - Cheng, Eric
AU - Mitra, Subhasish
AU - Schlichtmann, Ulf
N1 - Publisher Copyright:
© 2018 EDAA.
PY - 2018/4/19
Y1 - 2018/4/19
N2 - ETISS is an instruction set simulator (ISS) for Virtual Prototypes (VPs) modeled with SystemC/TLM. In this paper, we propose the extension ETISS-ML, which enables a multi-level simulation that switches between ISS-level and register transfer level (RTL) to accurately evaluate the impact of soft errors in the pipeline of a RISC processor. ETISS-ML achieves close-to-RTL-accurate fault injection simulation results with close-to-ISS simulation performance with a speed up gain up to 100x compared to RTL. For this, we propose an approach to dynamically determine the length of the RTL simulation period. The high simulation performance of ETISS-ML enables an ultra-efficient and accurate evaluation of cross-layer resiliency techniques for embedded applications, which requires running a large number of fault injections for long simulation scenarios. This is demonstrated on a case study of a Microcontroller Unit (MCU) executing a control algorithm for adaptive cruise control.
AB - ETISS is an instruction set simulator (ISS) for Virtual Prototypes (VPs) modeled with SystemC/TLM. In this paper, we propose the extension ETISS-ML, which enables a multi-level simulation that switches between ISS-level and register transfer level (RTL) to accurately evaluate the impact of soft errors in the pipeline of a RISC processor. ETISS-ML achieves close-to-RTL-accurate fault injection simulation results with close-to-ISS simulation performance with a speed up gain up to 100x compared to RTL. For this, we propose an approach to dynamically determine the length of the RTL simulation period. The high simulation performance of ETISS-ML enables an ultra-efficient and accurate evaluation of cross-layer resiliency techniques for embedded applications, which requires running a large number of fault injections for long simulation scenarios. This is demonstrated on a case study of a Microcontroller Unit (MCU) executing a control algorithm for adaptive cruise control.
UR - http://www.scopus.com/inward/record.url?scp=85048740199&partnerID=8YFLogxK
U2 - 10.23919/DATE.2018.8342081
DO - 10.23919/DATE.2018.8342081
M3 - Conference contribution
AN - SCOPUS:85048740199
T3 - Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
SP - 609
EP - 612
BT - Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 19 March 2018 through 23 March 2018
ER -