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Er
3+
luminescence in a-SiO
x
:H
A. Janotta
, M. Schmidt
, R. Janssen
, C. Buchal
,
M. Stutzmann
Walter Schottky Institut
Forschungszentrum Jülich (FZJ)
Research output
:
Contribution to journal
›
Article
›
peer-review
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3+
luminescence in a-SiO
x
:H'. Together they form a unique fingerprint.
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Keyphrases
SiOx
100%
Er3+ Luminescence
100%
Oxygen Content
75%
Erbium
50%
Hydrogenated Amorphous Silicon
25%
Room Temperature
25%
Optical Fiber
25%
Luminescence
25%
Silicon-based
25%
Photoluminescence
25%
Rare Earth Ions
25%
Defect Density
25%
Host Material
25%
Limited Solubility
25%
C-Si
25%
Implantation Dose
25%
Suboxide
25%
Er3+
25%
Silicon Suboxide
25%
Erbium Photoluminescence
25%
Host Matrix
25%
Material Science
Luminescence
100%
Erbium
100%
Photoluminescence
66%
Silicon
33%
Amorphous Silicon
33%
Defect Density
33%
Glass Fiber
33%
Chemical Engineering
Erbium
100%