Error-resistant single-qubit gates with trapped ions

N. Timoney, V. Elman, S. Glaser, C. Weiss, M. Johanning, W. Neuhauser, Chr Wunderlich

Research output: Contribution to journalArticlepeer-review

107 Scopus citations

Abstract

Coherent operations with individual trapped Yb+ ions are demonstrated that are robust against variations in experimental parameters and intrinsically indeterministic system parameters. In particular, pulses developed using optimal control theory are demonstrated with trapped ions. Their performance as a function of error parameters is systematically investigated and compared to composite pulses. Such pulses are basic building blocks for single and multiqubit quantum gates.

Original languageEnglish
Article number052334
JournalPhysical Review A
Volume77
Issue number5
DOIs
StatePublished - 30 May 2008

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