Erratum: Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70))

Robert Thalhammer; Gerhard Wachutka

doi:10.1109/TCAD.2004.825598

Erratum: Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70))

Robert Thalhammer
, Gerhard Wachutka

Computation, Information and Technology

Infineon Technologies AG

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	581-582
Number of pages	2
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	23
Issue number	4
DOIs	https://doi.org/10.1109/TCAD.2004.825598
State	Published - Apr 2004

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10.1109/TCAD.2004.825598

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Thalhammer, R., & Wachutka, G. (2004). Erratum: Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70)). IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 23(4), 581-582. https://doi.org/10.1109/TCAD.2004.825598

Thalhammer, Robert ; Wachutka, Gerhard. / Erratum : Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70)). In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2004 ; Vol. 23, No. 4. pp. 581-582.

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title = "Erratum: Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70))",

author = "Robert Thalhammer and Gerhard Wachutka",

year = "2004",

month = apr,

doi = "10.1109/TCAD.2004.825598",

language = "English",

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Thalhammer, R & Wachutka, G 2004, 'Erratum: Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70))', IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 23, no. 4, pp. 581-582. https://doi.org/10.1109/TCAD.2004.825598

Erratum: Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70)). / Thalhammer, Robert; Wachutka, Gerhard.
In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 23, No. 4, 04.2004, p. 581-582.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Erratum

T2 - Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70))

AU - Thalhammer, Robert

AU - Wachutka, Gerhard

PY - 2004/4

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DO - 10.1109/TCAD.2004.825598

M3 - Comment/debate

AN - SCOPUS:2342425185

SN - 0278-0070

VL - 23

SP - 581

EP - 582

JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IS - 4

ER -

Thalhammer R, Wachutka G. Erratum: Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70)). IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2004 Apr;23(4):581-582. doi: 10.1109/TCAD.2004.825598

Erratum: Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices (IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (Jan. 2004) 23 (60-70))

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