Growth of Si/SiGe superlattices on Si substrates by molecular beam epitaxy (MBE) is described. Strain symmetrization in the superlattice is achieved with an incommensurate SiGe buffer layer. The concept of strain-symmetrization is explained and properties of buffer and strained layer superlattices are investigated. A two-dimensional electron gas with enhanced room temperature mobility and folded phonon modes within the reduced one-dimensional Brillouin zone are observed. An n-channel Si/SiGe MODFET demonstrates the device applications of this material concept.