TY - GEN
T1 - Epipolar-based stereo tracking without explicit 3D reconstruction
AU - Gaschler, Andre
AU - Burschka, Darius
AU - Hager, Gregory
PY - 2010
Y1 - 2010
N2 - We present a general framework for tracking image regions in two views simultaneously based on sum-of-squared differences (SSD) minimization. Our method allows for motion models up to affine transformations. Contrary to earlier approaches, we incorporate the well-known epipolar constraints directly into the SSD optimization process. Since the epipolar geometry can be computed from the image directly, no prior calibration is necessary. Our algorithm has been tested in different applications including camera localization, wide-baseline stereo, object tracking and medical imaging. We show experimental results on robustness and accuracy compared to the known ground truth given by a conventional tracking device.
AB - We present a general framework for tracking image regions in two views simultaneously based on sum-of-squared differences (SSD) minimization. Our method allows for motion models up to affine transformations. Contrary to earlier approaches, we incorporate the well-known epipolar constraints directly into the SSD optimization process. Since the epipolar geometry can be computed from the image directly, no prior calibration is necessary. Our algorithm has been tested in different applications including camera localization, wide-baseline stereo, object tracking and medical imaging. We show experimental results on robustness and accuracy compared to the known ground truth given by a conventional tracking device.
KW - Epipolar geometry
KW - Stereo tracking
UR - https://www.scopus.com/pages/publications/78149478170
U2 - 10.1109/ICPR.2010.434
DO - 10.1109/ICPR.2010.434
M3 - Conference contribution
AN - SCOPUS:78149478170
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 1755
EP - 1758
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -