TY - GEN
T1 - Enhancing robustness of sequential circuits using application-specific knowledge and formal methods
AU - Huhn, Sebastian
AU - Frehse, Stefan
AU - Wille, Robert
AU - Drechsler, Rolf
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/2/16
Y1 - 2017/2/16
N2 - Due to shrinking feature sizes, integrated circuits are getting more vulnerable against transient faults. Methods increasing the robustness of circuits against these faults already exist for a long period of time but either introduce huge additional logic, increase the latency of the circuit, or are applicable for dedicated circuits such as microprocessors only. This work proposes an alternative hardening method which requires only a slight increase in additional hardware, does not influence the timing behavior, and is automatically applicable to arbitrary circuits. To this end, application-specific knowledge of the considered circuit is exploited, analyzed by a dedicated orchestration of formal techniques, and, eventually, used to synthesize a fault detection mechanism enhancing the robustness of the circuit. Experimental evaluations show that the proposed solution leads to a significant increase in the robustness, while the hardware overhead is kept moderate.
AB - Due to shrinking feature sizes, integrated circuits are getting more vulnerable against transient faults. Methods increasing the robustness of circuits against these faults already exist for a long period of time but either introduce huge additional logic, increase the latency of the circuit, or are applicable for dedicated circuits such as microprocessors only. This work proposes an alternative hardening method which requires only a slight increase in additional hardware, does not influence the timing behavior, and is automatically applicable to arbitrary circuits. To this end, application-specific knowledge of the considered circuit is exploited, analyzed by a dedicated orchestration of formal techniques, and, eventually, used to synthesize a fault detection mechanism enhancing the robustness of the circuit. Experimental evaluations show that the proposed solution leads to a significant increase in the robustness, while the hardware overhead is kept moderate.
UR - http://www.scopus.com/inward/record.url?scp=85015333110&partnerID=8YFLogxK
U2 - 10.1109/ASPDAC.2017.7858317
DO - 10.1109/ASPDAC.2017.7858317
M3 - Conference contribution
AN - SCOPUS:85015333110
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 182
EP - 187
BT - 2017 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017
Y2 - 16 January 2017 through 19 January 2017
ER -