Abstract
Quantum efficiencies (QE) in the vacuum ultraviolet (VUV) wavelength region have been measured for solid CsI layers on various substrates. The CsI films were deposited applying electron beam evaporation. The QE measurements were performed utilizing synchrotron radiation as well as light from a deuterium lamp. A GaAsP diode with a sensitivity calibration traceable to a primary radiation standard was used for normalization. For CsI layers grown on resin-stabilized graphite films a significant enhancement of QE was observed. Substrates suitable for gas detector applications and aging properties were investigated. The procedures to prepare and reproduce high quantum efficient CsI layers are described.
| Original language | English |
|---|---|
| Pages (from-to) | 86-93 |
| Number of pages | 8 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
| Volume | 438 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Dec 1999 |
| Event | Proceedings of the 1998 19th World Conference of the International Nuclear Target Development Society - Oak Ridge, TN, USA Duration: 5 Oct 1998 → 9 Oct 1998 |
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