Energy Optimization in NCFET-based Processors

Sami Salamin, Martin Rapp, Hussam Amrouch, Andreas Gerstlauer, Jorg Henkel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

Energy consumption is a key optimization goal for all modern processors. Negative Capacitance Field-Effect Transistors (NCFETs) are a leading emerging technology that promises outstanding performance in addition to better energy efficiency. Thickness of the additional ferroelectric layer, frequency, and voltage are the key parameters in NCFET technology that impact the power and frequency of processors. However, their joint impact on energy optimization has not been investigated yet.In this work, we are the first to demonstrate that conventional (i.e., NCFET-unaware) dynamic voltage/frequency scaling (DVFS) techniques to minimize energy are sub-optimal when applied to NCFET-based processors. We further demonstrate that state-of-the-art NCFET-aware voltage scaling for power minimization is also sub-optimal when it comes to energy. This work provides the first NCFET-aware DVFS technique that optimizes the processor's energy through optimal runtime frequency/voltage selection. In NCFETs, energy-optimal frequency and voltage are dependent on the workload and technology parameters. Our NCFET-aware DVFS technique considers these effects to perform optimal voltage/frequency selection at runtime depending on workload characteristics. Results show up to 90 % energy savings compared to conventional DVFS techniques. Compared to state-of-the-art NCFET-aware power management, our technique provides up to 72 % energy savings along with 3.7x higher performance.

Original languageEnglish
Title of host publicationProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
EditorsGiorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages630-633
Number of pages4
ISBN (Electronic)9783981926347
DOIs
StatePublished - Mar 2020
Externally publishedYes
Event2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 - Grenoble, France
Duration: 9 Mar 202013 Mar 2020

Publication series

NameProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020

Conference

Conference2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
Country/TerritoryFrance
CityGrenoble
Period9/03/2013/03/20

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