Electron traps in solid Xe

I. V. Khyzhniy; S. A. Uyutnov; E. V. Savchenko; G. B. Gumenchuk; A. N. Ponomaryov; V. E. Bondybey

doi:10.1063/1.3117964

Electron traps in solid Xe

I. V. Khyzhniy, S. A. Uyutnov, E. V. Savchenko, G. B. Gumenchuk, A. N. Ponomaryov, V. E. Bondybey

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Abstract

Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam are performed. The study enables us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects is estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.

Original language	English
Pages (from-to)	335-338
Number of pages	4
Journal	Low Temperature Physics
Volume	35
Issue number	4
DOIs	https://doi.org/10.1063/1.3117964
State	Published - 2009

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abstract = "Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam are performed. The study enables us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects is estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.",

author = "Khyzhniy, {I. V.} and Uyutnov, {S. A.} and Savchenko, {E. V.} and Gumenchuk, {G. B.} and Ponomaryov, {A. N.} and Bondybey, {V. E.}",

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AU - Khyzhniy, I. V.

AU - Uyutnov, S. A.

AU - Savchenko, E. V.

AU - Gumenchuk, G. B.

AU - Ponomaryov, A. N.

AU - Bondybey, V. E.

PY - 2009

Y1 - 2009

N2 - Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam are performed. The study enables us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects is estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.

AB - Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam are performed. The study enables us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects is estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.

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DO - 10.1063/1.3117964

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SN - 1063-777X

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SP - 335

EP - 338

JO - Low Temperature Physics

JF - Low Temperature Physics

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ER -

Electron traps in solid Xe

Abstract

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