Electromigrated molecular junctions

H. S.J. Van Der Zant; E. A. Osorio; M. Poot; K. O'Neill

doi:10.1002/pssb.200669185

Electromigrated molecular junctions

H. S.J. Van Der Zant
, E. A. Osorio
, M. Poot
, K. O'Neill

Kavli Institute of Nanoscience Delft

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

We report on the fabrication and characterization of molecular junctions which are fabricated with electromigration and subsequent trapping of the molecule from solution. Transport measurements show molecule-specific features (vibrational modes; gate coupling) and indicate the presence of a single molecule in the gap. Electromigrated junctions can be very stable and allow for temperature dependent measurements, which provide, next to gate dependent measurements, an additional tool to perform detailed studies of transmolecular conduction mechanisms.

Original language	English
Pages (from-to)	3408-3412
Number of pages	5
Journal	Physica Status Solidi (B) Basic Research
Volume	243
Issue number	13
DOIs	https://doi.org/10.1002/pssb.200669185
State	Published - Nov 2006
Externally published	Yes

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10.1002/pssb.200669185

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title = "Electromigrated molecular junctions",

abstract = "We report on the fabrication and characterization of molecular junctions which are fabricated with electromigration and subsequent trapping of the molecule from solution. Transport measurements show molecule-specific features (vibrational modes; gate coupling) and indicate the presence of a single molecule in the gap. Electromigrated junctions can be very stable and allow for temperature dependent measurements, which provide, next to gate dependent measurements, an additional tool to perform detailed studies of transmolecular conduction mechanisms.",

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AU - Van Der Zant, H. S.J.

AU - Osorio, E. A.

AU - Poot, M.

AU - O'Neill, K.

PY - 2006/11

Y1 - 2006/11

N2 - We report on the fabrication and characterization of molecular junctions which are fabricated with electromigration and subsequent trapping of the molecule from solution. Transport measurements show molecule-specific features (vibrational modes; gate coupling) and indicate the presence of a single molecule in the gap. Electromigrated junctions can be very stable and allow for temperature dependent measurements, which provide, next to gate dependent measurements, an additional tool to perform detailed studies of transmolecular conduction mechanisms.

AB - We report on the fabrication and characterization of molecular junctions which are fabricated with electromigration and subsequent trapping of the molecule from solution. Transport measurements show molecule-specific features (vibrational modes; gate coupling) and indicate the presence of a single molecule in the gap. Electromigrated junctions can be very stable and allow for temperature dependent measurements, which provide, next to gate dependent measurements, an additional tool to perform detailed studies of transmolecular conduction mechanisms.

UR - https://www.scopus.com/pages/publications/33751232937

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DO - 10.1002/pssb.200669185

M3 - Article

AN - SCOPUS:33751232937

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SP - 3408

EP - 3412

JO - Physica Status Solidi (B) Basic Research

JF - Physica Status Solidi (B) Basic Research

IS - 13

ER -

Electromigrated molecular junctions

Abstract

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