Electro-optic near-field mapping of planar resonators

Torsten Pfeifer; Torsten Löffler; Hartmut G. Roskos; Heinrich Kurz; Markus Singer; Erwin M. Biebl

doi:10.1109/8.660974

Electro-optic near-field mapping of planar resonators

Torsten Pfeifer, Torsten Löffler, Hartmut G. Roskos, Heinrich Kurz, Markus Singer, Erwin M. Biebl

Associate Professorship of Very High Frequency Technology

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

A comprehensive experimental and theoretical study for the determination of the electric near-field above planar resonators is presented. The transverse component of the electric field is mapped by external electro-optic (EO) sampling technique with high spatial and temporal resolution. The evolution of the near-field radiation pattern of the investigated 7-GHz planar resonator to the onset of the far-field pattern is traced by measurements at various heights above the sample. Frequencydependent measurements allow to characterize the field pattern changes when the frequency is swept through the main resonance. Additional undesired resonances are identified by the detected mode pattern. The experimental data are reproduced by simulations based upon an electric field integral equation (EFIE) method.

Original language	English
Pages (from-to)	284-291
Number of pages	8
Journal	IEEE Transactions on Antennas and Propagation
Volume	46
Issue number	2
DOIs	https://doi.org/10.1109/8.660974
State	Published - 1998

Keywords

Electro-optic measurements
Resonators

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10.1109/8.660974

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abstract = "A comprehensive experimental and theoretical study for the determination of the electric near-field above planar resonators is presented. The transverse component of the electric field is mapped by external electro-optic (EO) sampling technique with high spatial and temporal resolution. The evolution of the near-field radiation pattern of the investigated 7-GHz planar resonator to the onset of the far-field pattern is traced by measurements at various heights above the sample. Frequencydependent measurements allow to characterize the field pattern changes when the frequency is swept through the main resonance. Additional undesired resonances are identified by the detected mode pattern. The experimental data are reproduced by simulations based upon an electric field integral equation (EFIE) method.",

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AU - Löffler, Torsten

AU - Roskos, Hartmut G.

AU - Kurz, Heinrich

AU - Singer, Markus

AU - Biebl, Erwin M.

PY - 1998

Y1 - 1998

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AB - A comprehensive experimental and theoretical study for the determination of the electric near-field above planar resonators is presented. The transverse component of the electric field is mapped by external electro-optic (EO) sampling technique with high spatial and temporal resolution. The evolution of the near-field radiation pattern of the investigated 7-GHz planar resonator to the onset of the far-field pattern is traced by measurements at various heights above the sample. Frequencydependent measurements allow to characterize the field pattern changes when the frequency is swept through the main resonance. Additional undesired resonances are identified by the detected mode pattern. The experimental data are reproduced by simulations based upon an electric field integral equation (EFIE) method.

KW - Electro-optic measurements

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JO - IEEE Transactions on Antennas and Propagation

JF - IEEE Transactions on Antennas and Propagation

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ER -

Electro-optic near-field mapping of planar resonators

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Keywords

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