EG0N: Portable in-situ energy measurement for low-power sensor devices

Nils Heitmann, Philipp Kindt, Samarjit Chakraborty

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

For assessing the energy consumption of an embedded system, typically measurements on a shunting resistor are conducted in a laboratory environment. While such measurements can be easily performed with high precision for stationary setups, obtaining data on the energy-consumption of mobile devices, such as body-worn electronics (wearables) is a significantly more challenging task, since the power consumption depends on the behavior of the user. For example, consider an activity sensor which transmits the detected activity type (e.g., walking, running, resting) wirelessly to a smartphone whenever the activity changes. Clearly, more current is drawn for the transmission whenever the activity needs to be updated. Connecting the device with long wires to a stationary measurement platform distorts the results and restricts the motion of the user. Therefore, the measurement platform needs to be mobile itself to measure in-situ. This imposes multiple challenges on such a system, e.g., the limited power budget for obtaining samples of the current consumption and the need for miniaturized electronics. In this paper, we propose EG0N, a mobile current measurement platform for wearables. While addressing the mentioned challenges, it supports useful advanced features, such as collaborative, context-aware measurements on the device-under-test (DUT).

Original languageEnglish
Title of host publication2016 20th International Symposium on VLSI Design and Test, VDAT 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509014224
DOIs
StatePublished - 10 Oct 2017
Event20th International Symposium on VLSI Design and Test, VDAT 2016 - Guwahati, India
Duration: 24 May 201627 May 2016

Publication series

Name2016 20th International Symposium on VLSI Design and Test, VDAT 2016

Conference

Conference20th International Symposium on VLSI Design and Test, VDAT 2016
Country/TerritoryIndia
CityGuwahati
Period24/05/1627/05/16

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