TY - JOUR
T1 - Efficient spanning-tree-based test pattern generation for Programmable Microfluidic Devices
AU - Bernardini, Alessandro
AU - Liu, Chunfeng
AU - Li, Bing
AU - Schlichtmann, Ulf
N1 - Publisher Copyright:
© 2018 Elsevier Ltd
PY - 2018/9
Y1 - 2018/9
N2 - Microfluidic biochips are revolutionizing the traditional biochemical experiment flow with their high execution efficiency and miniaturized fluid manipulation. To improve the flexibility of such chips, Programmable Microfluidic Devices (PMDs) have been introduced, with valves and channels built as a regular array. To take advantage of this new architecture, design automation methods have started to appear, but an efficient test generation algorithm is still unavailable. In this paper, we propose to generate test patterns based on spanning trees for this architecture. Compared with previous work, the proposed method is around 100 times faster, while the number of test patterns is still comparable.
AB - Microfluidic biochips are revolutionizing the traditional biochemical experiment flow with their high execution efficiency and miniaturized fluid manipulation. To improve the flexibility of such chips, Programmable Microfluidic Devices (PMDs) have been introduced, with valves and channels built as a regular array. To take advantage of this new architecture, design automation methods have started to appear, but an efficient test generation algorithm is still unavailable. In this paper, we propose to generate test patterns based on spanning trees for this architecture. Compared with previous work, the proposed method is around 100 times faster, while the number of test patterns is still comparable.
KW - Manufacturing defects
KW - Microfluidic biochips
KW - Programmable Microfluidic Devices (PMDs)
KW - Test
UR - http://www.scopus.com/inward/record.url?scp=85049581429&partnerID=8YFLogxK
U2 - 10.1016/j.mejo.2018.06.011
DO - 10.1016/j.mejo.2018.06.011
M3 - Article
AN - SCOPUS:85049581429
SN - 0026-2692
VL - 79
SP - 38
EP - 45
JO - Microelectronics Journal
JF - Microelectronics Journal
ER -