| Original language | English |
|---|---|
| Pages (from-to) | 1992-1993 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 30 |
| Issue number | 2024 |
| DOIs | |
| State | Published - 24 Jul 2024 |
| Event | 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: 28 Jul 2024 → 1 Aug 2024 |
Effect of Single-Layer Graphene Substrate on Mitigating the Electron Beam Induced Damage in ZIF-8 Metal-Organic-Framework (MOF)
Pritam Banerjee, Sara Talebi Deylamani, Kathrin L. Kollmannsberger, Roland A. Fischer, Joerg R. Jinschek
Research output: Contribution to journal › Conference article › peer-review