Skip to main navigation Skip to search Skip to main content

Dynamic state-retention flip-flop for fine-grained power gating with small design and power overhead

  • Stephan Henzler
  • , Georg Georgakos
  • , Matthias Eireiner
  • , Thomas Nirschl
  • , Christian Pacha
  • , Joerg Berthold
  • , Doris Schmitt-Landsiedel
  • IEEE
  • Technical University of Munich
  • Infineon Technologies AG

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

Fine-grained power gating is the rigorous application of sleep transistor scheme to reduce stand-by power consumption in idle circuit blocks. Small circuit blocks are suspended for a short time while they are temporarily not needed. A sense-amplifier-based state retention flip-flop is proposed, that preserves the logical state of the circuit during these short idle periods. This dynamic state retention flip-flop requires neither additional control signals nor an additional power supply for its state retention functionality. An integration into a standard design flow is possible without any modifications. The tradeoff between propagation delay and retention time is derived analytically. Retention times in the range of milliseconds can be achieved with D-to-Q delays of 100 ps to 200 ps.

Original languageEnglish
Article number1644877
Pages (from-to)1654-1660
Number of pages7
JournalIEEE Journal of Solid-State Circuits
Volume41
Issue number7
DOIs
StatePublished - Jul 2006

Keywords

  • Leakage reduction
  • Low power
  • MTCMOS
  • Power gating
  • Retention flip-flop
  • Sleep transistor
  • State retention

Fingerprint

Dive into the research topics of 'Dynamic state-retention flip-flop for fine-grained power gating with small design and power overhead'. Together they form a unique fingerprint.

Cite this