Skip to main navigation Skip to search Skip to main content

DX behaviour of Si donors in AlGaN alloys

  • Martin S. Brandt
  • , Roland Zeisel
  • , Sebastian T.B. Gönnenwein
  • , Martin W. Bayerl
  • , Martin Stutzmann
  • Walter Schottky Institut

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Recent experiments on the DX behaviour of Si in AlGaN alloys are reviewed. From persistent photoconductivity, light-induced electron spin resonance, and thermal quenching experiments as well as from the thermal activation of the generation-recombination noise, a quantitative configuration coordinate diagram is constructed for pure AlN and Al0.75Ga0.25N. The effects of DX centres on the properties of AlGaN alloys with lower Al concentration are discussed.

Original languageEnglish
Pages (from-to)13-19
Number of pages7
JournalPhysica Status Solidi (B) Basic Research
Volume235
Issue number1
DOIs
StatePublished - Jan 2003

Fingerprint

Dive into the research topics of 'DX behaviour of Si donors in AlGaN alloys'. Together they form a unique fingerprint.

Cite this