Abstract
Recent experiments on the DX behaviour of Si in AlGaN alloys are reviewed. From persistent photoconductivity, light-induced electron spin resonance, and thermal quenching experiments as well as from the thermal activation of the generation-recombination noise, a quantitative configuration coordinate diagram is constructed for pure AlN and Al0.75Ga0.25N. The effects of DX centres on the properties of AlGaN alloys with lower Al concentration are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 13-19 |
| Number of pages | 7 |
| Journal | Physica Status Solidi (B) Basic Research |
| Volume | 235 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 2003 |
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