Dopant states and recombination in compensated a-Si:H

Martin Stutzmann, David K. Biegelsen, Robert A. Street

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The role of gap states introduced by compensation of a-Si:H for the trapping and recombination processes in this material are examined using magnetic resonance techniques (LESR and ODMR). It is found that neutral donor states rather than conduction band tail states are the dominant electron traps for high compensation levels. A new ODMR resonance is observed and interpreted as due to exchange coupled electron-hole pairs.

Original languageEnglish
Pages (from-to)647-650
Number of pages4
JournalJournal of Non-Crystalline Solids
Volume77-78
Issue numberPART 1
DOIs
StatePublished - 2 Dec 1985
Externally publishedYes

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