Abstract
The role of gap states introduced by compensation of a-Si:H for the trapping and recombination processes in this material are examined using magnetic resonance techniques (LESR and ODMR). It is found that neutral donor states rather than conduction band tail states are the dominant electron traps for high compensation levels. A new ODMR resonance is observed and interpreted as due to exchange coupled electron-hole pairs.
Original language | English |
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Pages (from-to) | 647-650 |
Number of pages | 4 |
Journal | Journal of Non-Crystalline Solids |
Volume | 77-78 |
Issue number | PART 1 |
DOIs | |
State | Published - 2 Dec 1985 |
Externally published | Yes |