Directional x-ray dark-field imaging of strongly ordered systems

Torben Haugaard Jensen, Martin Bech, Irene Zanette, Timm Weitkamp, Christian David, Hans Deyhle, Simon Rutishauser, Elena Reznikova, Jürgen Mohr, Robert Feidenhans'L, Franz Pfeiffer

Research output: Contribution to journalArticlepeer-review

86 Scopus citations

Abstract

Recently a novel grating based x-ray imaging approach called directional x-ray dark-field imaging was introduced. Directional x-ray dark-field imaging yields information about the local texture of structures smaller than the pixel size of the imaging system. In this work we extend the theoretical description and data processing schemes for directional dark-field imaging to strongly scattering systems, which could not be described previously. We develop a simple scattering model to account for these recent observations and subsequently demonstrate the model using experimental data. The experimental data includes directional dark-field images of polypropylene fibers and a human tooth slice.

Original languageEnglish
Article number214103
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume82
Issue number21
DOIs
StatePublished - 6 Dec 2010

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