TY - GEN
T1 - Digital design at a crossroads
T2 - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
AU - Schlichtmann, Ulf
AU - Schmidt, Manuel
AU - Kinzelbach, Harald
AU - Pronath, Michael
AU - Glöckel, Volker
AU - Dietrich, Manfred
AU - Eichler, Uwe
AU - Haase, Joachim
PY - 2009
Y1 - 2009
N2 - Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Research into this field has seen significant activity started about five years ago. Recently, interest appears to have fallen off somewhat. Also, while a lot of focus has been put on research fundamentals, extremely few applications in industry have been reported so far. Therefore, a group including Infineon Technologies as a leading semiconductor IDM and various universities and research institutes, as well as an EDA provider has tackled key challenges to enable statistical design in industry in a publicly funded project called "Sigma65". Sigma65 strives to provide key foundations to allow a change from traditional deterministic design methods to future design methods driven by statistical considerations. The project starts with statistical modeling and optimization of library components and ranges to statistical techniques for designing ICs on gate level and higher levels. In this paper, we present some results of this project, demonstrating how the interaction between industrial perspective, research institutions and EDA provider enables solutions which are applicable already in the near future. After an overview of the industrial perspective of the current situation in dealing with variations recent results on both statistical timing and power analysis will be given. In addition, recent research advances on fast yield estimation concerning parametric timing yield will be given.
AB - Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Research into this field has seen significant activity started about five years ago. Recently, interest appears to have fallen off somewhat. Also, while a lot of focus has been put on research fundamentals, extremely few applications in industry have been reported so far. Therefore, a group including Infineon Technologies as a leading semiconductor IDM and various universities and research institutes, as well as an EDA provider has tackled key challenges to enable statistical design in industry in a publicly funded project called "Sigma65". Sigma65 strives to provide key foundations to allow a change from traditional deterministic design methods to future design methods driven by statistical considerations. The project starts with statistical modeling and optimization of library components and ranges to statistical techniques for designing ICs on gate level and higher levels. In this paper, we present some results of this project, demonstrating how the interaction between industrial perspective, research institutions and EDA provider enables solutions which are applicable already in the near future. After an overview of the industrial perspective of the current situation in dealing with variations recent results on both statistical timing and power analysis will be given. In addition, recent research advances on fast yield estimation concerning parametric timing yield will be given.
KW - Digital IC design
KW - Simulation
KW - Statistical power analysis
KW - Statistical timing analysis
UR - http://www.scopus.com/inward/record.url?scp=70350046953&partnerID=8YFLogxK
U2 - 10.1109/date.2009.5090907
DO - 10.1109/date.2009.5090907
M3 - Conference contribution
AN - SCOPUS:70350046953
SN - 9783981080155
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1542
EP - 1547
BT - Proceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 20 April 2009 through 24 April 2009
ER -