Did we test enough? Functional coverage for post-silicon validation

Sebastian Pointner, Robert Wille

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The ever increasing complexity of modern systems remains a challenge for semiconductor companies. Once a new chip has been produced, it has to be ensured that it works properly. To this end, sophisticated test environments and test programs are applied. However, to ensure that the applied test program indeed fully covers all important details of the produced chip remains a big challenge. In this work, we propose a methodology which supports the designer by analyzing the coverage of a given test program. To this end, we utilize accomplishments from coverage analysis for functional verification at other abstraction levels. A discussion of the resulting application scenario eventually shows that this allows for an efficient coverage analysis for test programs with basically no changes in the work-flows of test program developers.

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages31-36
Number of pages6
ISBN (Electronic)9781728147185
DOIs
StatePublished - Sep 2019
Externally publishedYes
Event3rd IEEE International Test Conference in Asia, ITC-Asia 2019 - Tokyo, Japan
Duration: 3 Sep 20195 Sep 2019

Publication series

NameProceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019

Conference

Conference3rd IEEE International Test Conference in Asia, ITC-Asia 2019
Country/TerritoryJapan
CityTokyo
Period3/09/195/09/19

Keywords

  • Automatic Test Equipment
  • Functional Coverage
  • Post Silicon Validation

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