Device/circuit interactions in highly-scaled CMOS: Challenges and potential solutions

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Article number4419021
Pages (from-to)641
Number of pages1
JournalTechnical Digest - International Electron Devices Meeting
DOIs
StatePublished - 2007
Externally publishedYes
Event2007 IEEE International Electron Devices Meeting, IEDM - Washington, DC, United States
Duration: 10 Dec 200712 Dec 2007

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