Device-level compact modeling of perpendicular Nanomagnetic Logic for benchmarking purposes

Stephan Breitkreutz V. Gamm, Grazvydas Ziemys, Irina Eichwald, Doris Schmitt-Landsiedel, Markus Becherer, Gyorgy Csaba, Gary H. Bernstein, Wolfgang Porod

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

We show that physical-based compact modeling of field-coupled magnets is highly suitable to benchmark perpendicular Nanomagnetic Logic for comparison with other beyond-CMOS device candidates. Compact models enable simulation of the device behavior depending on the magnet's geometry, material, fabrication variations, clocking speed, temperature and noise. Logic computing reliability of the device is determined by simulation, and common physical measures (area, power, delay) are extracted for benchmarking purposes. The computational throughput is calculated for comparison with CMOS and further emerging beyond-CMOS devices. As an example, a 1-bit full adder circuit is analyzed in terms of progressive scaling, clocking speed and material improvements. The results show that - in addition to the area reduction - scaling significantly decreases the computing error rate, and enables an increase in the clocking frequency, whereas material improvements reduce the power consumption. The computational throughput as a common measure for the performance of the full adder circuit is equivalent, or even higher than, full adder circuits in CMOS and other beyond-CMOS technologies.

Original languageEnglish
Title of host publicationIEEE-NANO 2015 - 15th International Conference on Nanotechnology
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1033-1036
Number of pages4
ISBN (Electronic)9781467381550
DOIs
StatePublished - 2015
Event15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy
Duration: 27 Jul 201530 Jul 2015

Publication series

NameIEEE-NANO 2015 - 15th International Conference on Nanotechnology

Conference

Conference15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
Country/TerritoryItaly
CityRome
Period27/07/1530/07/15

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