TY - GEN
T1 - Development and evaluation of a realtime time-domain EMI measurement system for automotive testing
AU - Braun, Stephan
AU - Aidam, Martin
AU - Russer, Peter
PY - 2007
Y1 - 2007
N2 - Time-domain EMI Measurement Systems allow to reduce the measurement time by several orders of magnitude. In this paper a realtime time-domain emi measurement system for automotive testing is presented. Automotive tests require smaller frequency bins and a smaller IF-Bandwidth. In frequency domain such measurements take extremely long, sometimes they exceed the life-time of a component. A novel real-time time-domain emi measurement system is presented that reduces the time for automotive measurements by a factor of 8000. By a numerical oscillator in the signal processing unit the picket fence effect is reduced. Measurements have been performed on components and on a complete vehicle in the frequency range 30 MHz - 1 GHz. The real-time time-domain emi measurement system has been evaluated and assessed in a automotive test environment.
AB - Time-domain EMI Measurement Systems allow to reduce the measurement time by several orders of magnitude. In this paper a realtime time-domain emi measurement system for automotive testing is presented. Automotive tests require smaller frequency bins and a smaller IF-Bandwidth. In frequency domain such measurements take extremely long, sometimes they exceed the life-time of a component. A novel real-time time-domain emi measurement system is presented that reduces the time for automotive measurements by a factor of 8000. By a numerical oscillator in the signal processing unit the picket fence effect is reduced. Measurements have been performed on components and on a complete vehicle in the frequency range 30 MHz - 1 GHz. The real-time time-domain emi measurement system has been evaluated and assessed in a automotive test environment.
UR - http://www.scopus.com/inward/record.url?scp=47749105684&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2007.169
DO - 10.1109/ISEMC.2007.169
M3 - Conference contribution
AN - SCOPUS:47749105684
SN - 1424413508
SN - 9781424413508
T3 - IEEE International Symposium on Electromagnetic Compatibility
BT - IEEE International Symposium on Electromagnetic Compatibility, EMC 2007
T2 - IEEE International Symposium on Electromagnetic Compatibility, EMC 2007
Y2 - 9 July 2007 through 13 July 2007
ER -