TY - GEN
T1 - Determining pull-in curves with electromechanical FEM models
AU - Hannot, Stephan D.A.
AU - Rixen, Daniel J.
PY - 2008
Y1 - 2008
N2 - This paper presents a short overview of the different approaches to compute the pull-in curve for discretized models of electrostatically actuated microsystems that are currently available in the literature. The focus is on the so-called 'staggered' algorithms. A new method to improve these existing approaches by using charge loading is proposed. The performance of the algorithms is tested with some numerical experiments: FEM models of microbeams, used to model microswitches. The results show that the charge loading scheme provides a fast converging alternative for the traditional path-following approaches.
AB - This paper presents a short overview of the different approaches to compute the pull-in curve for discretized models of electrostatically actuated microsystems that are currently available in the literature. The focus is on the so-called 'staggered' algorithms. A new method to improve these existing approaches by using charge loading is proposed. The performance of the algorithms is tested with some numerical experiments: FEM models of microbeams, used to model microswitches. The results show that the charge loading scheme provides a fast converging alternative for the traditional path-following approaches.
UR - http://www.scopus.com/inward/record.url?scp=49249137337&partnerID=8YFLogxK
U2 - 10.1109/ESIME.2008.4525057
DO - 10.1109/ESIME.2008.4525057
M3 - Conference contribution
AN - SCOPUS:49249137337
SN - 9781424421282
T3 - EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems
BT - EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems
T2 - EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems
Y2 - 20 April 2008 through 23 April 2008
ER -