Determining adsorbate structures from substrate emission X-ray photoelectron diffraction

Matthias Muntwiler; Willi Auwärter; Felix Baumberger; Moritz Hoesch; Thomas Greber; Jürg Osterwalder

doi:10.1016/S0039-6028(00)00928-6

Determining adsorbate structures from substrate emission X-ray photoelectron diffraction

Matthias Muntwiler
, Willi Auwärter
, Felix Baumberger
, Moritz Hoesch
, Thomas Greber
, Jürg Osterwalder

University of Zurich
Paul Scherrer Institut

Research output: Contribution to journal › Article › peer-review

60 Scopus citations

Abstract

A new substrate emission X-ray photoelectron diffraction method that subtracts a clean substrate measurement from a measurement of the adsorbate-covered sample is able to reveal important adsorbate-substrate registry information while it suppresses disturbing substrate effects in the diffractograms. Short measurement times and an unambiguous data quality allow for a quick and convincing structural characterization of homogeneous adsorbate layers. The data processing and analysis methods are illustrated with experimental h-BN/Ni(1 1 1) data and multiple-scattering calculations.

Original language	English
Pages (from-to)	125-132
Number of pages	8
Journal	Surface Science
Volume	472
Issue number	1-2
DOIs	https://doi.org/10.1016/S0039-6028(00)00928-6
State	Published - 20 Jan 2001
Externally published	Yes

Keywords

Boron nitride
Electron-solid diffraction
Nickel
Photoelectron diffraction
Surface structure, morphology, roughness, and topography

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10.1016/S0039-6028(00)00928-6

Cite this

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title = "Determining adsorbate structures from substrate emission X-ray photoelectron diffraction",

abstract = "A new substrate emission X-ray photoelectron diffraction method that subtracts a clean substrate measurement from a measurement of the adsorbate-covered sample is able to reveal important adsorbate-substrate registry information while it suppresses disturbing substrate effects in the diffractograms. Short measurement times and an unambiguous data quality allow for a quick and convincing structural characterization of homogeneous adsorbate layers. The data processing and analysis methods are illustrated with experimental h-BN/Ni(1 1 1) data and multiple-scattering calculations.",

keywords = "Boron nitride, Electron-solid diffraction, Nickel, Photoelectron diffraction, Surface structure, morphology, roughness, and topography",

author = "Matthias Muntwiler and Willi Auw{\"a}rter and Felix Baumberger and Moritz Hoesch and Thomas Greber and J{\"u}rg Osterwalder",

note = "Funding Information: We are grateful to Prof. Heinrich N{\"o}th for the production of borazine and to Werner Deichmann for the technical support. This work has been supported by the Swiss National Science Foundation.",

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doi = "10.1016/S0039-6028(00)00928-6",

language = "English",

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TY - JOUR

T1 - Determining adsorbate structures from substrate emission X-ray photoelectron diffraction

AU - Muntwiler, Matthias

AU - Auwärter, Willi

AU - Baumberger, Felix

AU - Hoesch, Moritz

AU - Greber, Thomas

AU - Osterwalder, Jürg

N1 - Funding Information: We are grateful to Prof. Heinrich Nöth for the production of borazine and to Werner Deichmann for the technical support. This work has been supported by the Swiss National Science Foundation.

PY - 2001/1/20

Y1 - 2001/1/20

N2 - A new substrate emission X-ray photoelectron diffraction method that subtracts a clean substrate measurement from a measurement of the adsorbate-covered sample is able to reveal important adsorbate-substrate registry information while it suppresses disturbing substrate effects in the diffractograms. Short measurement times and an unambiguous data quality allow for a quick and convincing structural characterization of homogeneous adsorbate layers. The data processing and analysis methods are illustrated with experimental h-BN/Ni(1 1 1) data and multiple-scattering calculations.

AB - A new substrate emission X-ray photoelectron diffraction method that subtracts a clean substrate measurement from a measurement of the adsorbate-covered sample is able to reveal important adsorbate-substrate registry information while it suppresses disturbing substrate effects in the diffractograms. Short measurement times and an unambiguous data quality allow for a quick and convincing structural characterization of homogeneous adsorbate layers. The data processing and analysis methods are illustrated with experimental h-BN/Ni(1 1 1) data and multiple-scattering calculations.

KW - Boron nitride

KW - Electron-solid diffraction

KW - Nickel

KW - Photoelectron diffraction

KW - Surface structure, morphology, roughness, and topography

UR - https://www.scopus.com/pages/publications/0001184318

U2 - 10.1016/S0039-6028(00)00928-6

DO - 10.1016/S0039-6028(00)00928-6

M3 - Article

AN - SCOPUS:0001184318

SN - 0039-6028

VL - 472

SP - 125

EP - 132

JO - Surface Science

JF - Surface Science

IS - 1-2

ER -

Determining adsorbate structures from substrate emission X-ray photoelectron diffraction

Abstract

Keywords

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