Determining adsorbate structures from substrate emission X-ray photoelectron diffraction

Matthias Muntwiler, Willi Auwärter, Felix Baumberger, Moritz Hoesch, Thomas Greber, Jürg Osterwalder

Research output: Contribution to journalArticlepeer-review

58 Scopus citations

Abstract

A new substrate emission X-ray photoelectron diffraction method that subtracts a clean substrate measurement from a measurement of the adsorbate-covered sample is able to reveal important adsorbate-substrate registry information while it suppresses disturbing substrate effects in the diffractograms. Short measurement times and an unambiguous data quality allow for a quick and convincing structural characterization of homogeneous adsorbate layers. The data processing and analysis methods are illustrated with experimental h-BN/Ni(1 1 1) data and multiple-scattering calculations.

Original languageEnglish
Pages (from-to)125-132
Number of pages8
JournalSurface Science
Volume472
Issue number1-2
DOIs
StatePublished - 20 Jan 2001
Externally publishedYes

Keywords

  • Boron nitride
  • Electron-solid diffraction
  • Nickel
  • Photoelectron diffraction
  • Surface structure, morphology, roughness, and topography

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