Abstract
A new substrate emission X-ray photoelectron diffraction method that subtracts a clean substrate measurement from a measurement of the adsorbate-covered sample is able to reveal important adsorbate-substrate registry information while it suppresses disturbing substrate effects in the diffractograms. Short measurement times and an unambiguous data quality allow for a quick and convincing structural characterization of homogeneous adsorbate layers. The data processing and analysis methods are illustrated with experimental h-BN/Ni(1 1 1) data and multiple-scattering calculations.
Original language | English |
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Pages (from-to) | 125-132 |
Number of pages | 8 |
Journal | Surface Science |
Volume | 472 |
Issue number | 1-2 |
DOIs | |
State | Published - 20 Jan 2001 |
Externally published | Yes |
Keywords
- Boron nitride
- Electron-solid diffraction
- Nickel
- Photoelectron diffraction
- Surface structure, morphology, roughness, and topography