Determination of waiting times between successive breakdown experiments

M. Koch, U. Straumann, C. M. Franck

Research output: Contribution to journalConference articlepeer-review

20 Scopus citations

Abstract

A common duty in high voltage engineering is the experimental determination of the breakdown voltage probability distribution of gaseous insulated electrode configurations. Due to electron detachment from negative ions in the case of electron attaching gases, the breakdown probability does not only depend on the gas and its density, but also on the ion density in the gas. If a disruptive discharge occurs in a gas gap, the number of ions in the gap is significantly increased compared to the equilibrium state at zero voltage. If the time until the next voltage application is too short, the statistical time lag will be decreased and, as a consequence, the probability of breakdown will be increased. To perform statistical independent breakdown experiments it is necessary to ensure identical ion densities in the gas gap before every new voltage application. In the literature waiting times mostly around six minutes are proposed as sufficient for ion density equalization in sulfur hexafluoride (SF6). However, simulations of the behavior of SF6 performed for the present contribution reveal that six minutes are not always sufficient to achieve statistical independent results. Especially at higher pressures longer waiting times are necessary. To investigate this problem, measurements of the natural ion pair generation in SF6 were performed at different laboratories. Based on this data the temporal development of the ion distribution in the gas is calculated. Two cases are of interest: the changes in ion density after a disruptive discharge and in case the gap withstood the applied voltage and therefore all ions are swept out. After transformation of the temporal ion density into breakdown probability curves it is possible to estimate the necessary waiting time.

Original languageEnglish
Article number6378792
Pages (from-to)349-352
Number of pages4
JournalConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
DOIs
StatePublished - 2012
Externally publishedYes
Event2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2012 - Montreal, QC, Canada
Duration: 14 Oct 201217 Oct 2012

Fingerprint

Dive into the research topics of 'Determination of waiting times between successive breakdown experiments'. Together they form a unique fingerprint.

Cite this