Determination of temperature gradients with micrometric resolution by local open circuit potential measurements at a scanning microelectrode

Aya Sode, Michaela Nebel, Piyanut Pinyou, Sebastian Schmaderer, Jan Szeponik, Nicolas Plumeré, Wolfgang Schuhmann

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

A method to determine localized temperature profiles using a scanning electrochemical microscopy (SECM) setup and potentiometry is presented. A Pt microelectrode was first calibrated to correlate the open circuit potential (OCP) with temperature in an electrolyte containing ferri/ferrocyanide. Using the calibration graph, the temperature at a given position and a time could be derived. For dynamic measurements, the thermal expansion of the surface was initially determined using shear force mode SECM. Following the OCP at the microelectrode static as well as dynamic temperature gradients above the heated surface were successfully probed and visualized with vertical micrometric resolution and with precision in temperature determination below 1°C.

Original languageEnglish
Pages (from-to)2084-2091
Number of pages8
JournalElectroanalysis
Volume25
Issue number9
DOIs
StatePublished - Sep 2013
Externally publishedYes

Keywords

  • Heated electrodes
  • Local temperature gradient measurement
  • Potentiometry
  • SECM
  • Scanning electrochemical microscope
  • Thermal expansion measurement

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