TY - GEN
T1 - Determination of Complex Permittivity of LRR Radome Materials Using a Scalar Quasi-Optical Measurement System
AU - Pfeiffer, F.
AU - Biebl, E.
AU - Siedersberger, K. H.
PY - 2008
Y1 - 2008
N2 - We developed a low-cost quasi-optical measurement system to determine the complex permittivity in the E-band (from 60 to 90 GHz). The evaluation is done in a non-destructive way and can be used for all kinds of single-layered and multi-layered dielectric materials. The method is based on measurements of the scalar transmission coefficient through planar samples for several angles of incidence and two different polarization states (parallel and perpendicular to the plane of incidence). A numerical optimization technique is used to derive the complex permittivity from the measured coefficients. The method utilizes a physical model of a dielectric slab of known thickness, which assumes that a plane wave is incident on the surface of the dielectric material. Measurement results are presented, which are in good agreement with data from the literature.
AB - We developed a low-cost quasi-optical measurement system to determine the complex permittivity in the E-band (from 60 to 90 GHz). The evaluation is done in a non-destructive way and can be used for all kinds of single-layered and multi-layered dielectric materials. The method is based on measurements of the scalar transmission coefficient through planar samples for several angles of incidence and two different polarization states (parallel and perpendicular to the plane of incidence). A numerical optimization technique is used to derive the complex permittivity from the measured coefficients. The method utilizes a physical model of a dielectric slab of known thickness, which assumes that a plane wave is incident on the surface of the dielectric material. Measurement results are presented, which are in good agreement with data from the literature.
KW - Complex permittivity
KW - Material characterization
KW - Microwave measurement
KW - Quasi-optical measurement
UR - http://www.scopus.com/inward/record.url?scp=84884358409&partnerID=8YFLogxK
U2 - 10.1007/978-3-540-77980-3
DO - 10.1007/978-3-540-77980-3
M3 - Conference contribution
AN - SCOPUS:84884358409
SN - 9783540779797
T3 - Advanced Microsystems for Automotive Applications 2008
SP - 205
EP - 210
BT - Advanced Microsystems for Automotive Applications 2008
T2 - 12th International Forum on Advanced Microsystems for Automotive Applications, AMAA 2008
Y2 - 11 March 2008 through 12 March 2008
ER -